WEBINAR - Metrology Extension for 3D X-ray Microscopes

| Medlemsnyhed | Indrykket af Carl Zeiss A/S

By adding Measurement Accuracy to X-ray Microscopy the MTX option extends ZEISS world-class metrology offerings to the well-known, high-resolution imaging capabilities of ZEISS 3D X-ray microscopes.

Learn more in this webinar 17th September 2020!


Highlights of webinar:

  • Combine high-resolution X-ray imaging with high-precision metrology capabilities.
  • Measure with an accuracy far beyond the limits of conventional X-ray CT metrology.
  • Use seamless accuracy verification in accordance with the VDI/VDE 2630-1.3 part 1.
  • Non-destructively inspect the design of a part’s complex internal and external features.
  • Reveal the smallest dimensions and measure them most accurately.


Indrykket af
Carl Zeiss A/S

Bregnerødvej 133A, 1. sal
3460 Birkerød
Carl Zeiss A/S

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