Near Axis TKD detector

1.1.

Buyer

Official name : Danmarks Tekniske Universitet - DTU

Email : perach@dtu.dk

Legal type of the buyer : Body governed by public law

Activity of the contracting authority : Education

2.1.

Procedure

Title : Near Axis TKD detector

Description : DTU Nanolab intends to procure a high-end Transmission Kikuchi Diffraction (TKD) acquisition system for characterization of delicate and sensitive crystalline materials. The system will be mounted and integrated into an already existing Scanning Electron Microscope. Crystal orientation mapping and strain analysis of beam sensitive thin films of functional materials at the nanometer scale is essential for understanding the underlying processes responsible for the (tailored) functionality. DTU Nanolab intends to procure a high-end Transmission Kikuchi Diffraction (TKD) acquisition system for characterization of delicate and sensitive crystalline materials. The system will be mounted and integrated into an already existing Scanning Electron Microscope. Crystal orientation mapping and strain analysis of beam sensitive thin films of functional materials at the nanometer scale is essential for understanding the underlying processes responsible for the (tailored) functionality.

Procedure identifier : 2624c551-1cb2-4764-b35d-d65ae9f3bcdb

Internal identifier : 9365

Type of procedure : Negotiated without prior call for competition

2.1.1.

Purpose

Main nature of the contract : Supplies

Main classification ( cpv ): 38519300 Photo or video attachments for microscopes

2.1.2.

Place of performance

Postal address : Anker Engelundsvej 1

Town : Kongens Lyngby

Postcode : 2800

Country subdivision (NUTS) : Nordsjælland ( DK013 )

Country : Denmark

2.1.4.

General information

Additional information : The high-end TKD acquisition system to be procured must fulfil the requirements for high-end materials science research and the following criteria: - Pixelated electron detector for efficient TKD pattern acquisition. Suitable and optimized for high angular resolution (HR) TKD pattern acquisition. At least 1MPx is required to obtain the necessary precision in strain analysis of tailored materials. - Efficient data collection (TKD patterns) with low electron beam-current suitable for electron beam sensitive materials. - Optimized detector geometry for forward scattered electron diffraction acquisition for high spatial resolution orientation mapping of thin films. - Detector geometry for acquiring combined spot pattern and Kikuchi pattern (low and high scattering angle) with high pixel resolution. - Integrated elemental analysis (EDX) - Compatible with Thermo Fischer / FEI SEM instruments (Novo NanoSEM 600, Helios NanoLab 600) - Automated large area mapping for combined EBSD/TKD and EDX mapping - Integrated software solution for diffraction data analysis. Delivery and installation within Q4 of 2024 would be preferable for DTU Nanolab due to fundings.

Legal basis :

Directive 2014/24/EU

5.1.

Lot : LOT-0000

Title : Near Axis TKD detector

Description : DTU Nanolab intends to procure a high-end Transmission Kikuchi Diffraction (TKD) acquisition system for characterization of delicate and sensitive crystalline materials. The system will be mounted and integrated into an already existing Scanning Electron Microscope. Crystal orientation mapping and strain analysis of beam sensitive thin films of functional materials at the nanometer scale is essential for understanding the underlying processes responsible for the (tailored) functionality. DTU Nanolab intends to procure a high-end Transmission Kikuchi Diffraction (TKD) acquisition system for characterization of delicate and sensitive crystalline materials. The system will be mounted and integrated into an already existing Scanning Electron Microscope. Crystal orientation mapping and strain analysis of beam sensitive thin films of functional materials at the nanometer scale is essential for understanding the underlying processes responsible for the (tailored) functionality.

Internal identifier : 9365

5.1.1.

Purpose

Main nature of the contract : Supplies

Main classification ( cpv ): 38519300 Photo or video attachments for microscopes

5.1.2.

Place of performance

Postal address : Anker Engelundsvej 1

Town : Kongens Lyngby

Postcode : 2800

Country subdivision (NUTS) : Nordsjælland ( DK013 )

Country : Denmark

5.1.3.

Estimated duration

Other duration : Unlimited

5.1.6.

General information

Procurement Project not financed with EU Funds.

The procurement is covered by the Government Procurement Agreement (GPA) : yes

Additional information : The high-end TKD acquisition system to be procured must fulfil the requirements for high-end materials science research and the following criteria: - Pixelated electron detector for efficient TKD pattern acquisition. Suitable and optimized for high angular resolution (HR) TKD pattern acquisition. At least 1MPx is required to obtain the necessary precision in strain analysis of tailored materials. - Efficient data collection (TKD patterns) with low electron beam-current suitable for electron beam sensitive materials. - Optimized detector geometry for forward scattered electron diffraction acquisition for high spatial resolution orientation mapping of thin films. - Detector geometry for acquiring combined spot pattern and Kikuchi pattern (low and high scattering angle) with high pixel resolution. - Integrated elemental analysis (EDX) - Compatible with Thermo Fischer / FEI SEM instruments (Novo NanoSEM 600, Helios NanoLab 600) - Automated large area mapping for combined EBSD/TKD and EDX mapping - Integrated software solution for diffraction data analysis. Delivery and installation within Q4 of 2024 would be preferable for DTU Nanolab due to fundings.

5.1.12.

Terms of procurement

Information about review deadlines : Complaint that the Contracting Authority, contrary to the Public Procurement Act, has concluded a contract without prior publication of a contract notice in the European Union Official Journal must be submitted no later than 30 calendar days from the date after a contract award notice has been published by the Contracting Authority in the European Union Official Journal and that contract award notice includes the grounds for the decision to award the contract directly, cf. lov om Klagenævnet for Udbud (Complaints Board for Tenders) § 7, section 3.

5.1.15.

Techniques

Framework agreement : No framework agreement

Information about the dynamic purchasing system : No dynamic purchase system

5.1.16.

Further information, mediation and review

Review organisation : Klagenævnet for Udbud

Organisation providing information concerning the general regulatory framework for taxes applicable in the place where the contract is to be performed : Konkurrence- og Forbrugerstyrelsen

Organisation whose budget is used to pay for the contract : Danmarks Tekniske Universitet - DTU

Organisation executing the payment : Danmarks Tekniske Universitet - DTU

Organisation signing the contract : Danmarks Tekniske Universitet - DTU

TED eSender : Mercell Holding ASA

Value of all contracts awarded in this notice : 271 532,00 EUR

Direct award :

Justification for direct award : The contract can be provided only by a particular economic operator because of an absence of competition for technical reasons

Other justification : Purchasing the Near Axis TKD (NA-TKD) detector system from Oxford Instruments GmbH will fulfil the requirements from DTU Nanolab and its user base for materials characterization as described above. The highly sensitive camera with optimized geometry for low current TKD pattern more than fulfils the scientific requirements for probing high-precision grain orientation and strain measurements of sensitive thin-film materials at the nanometer scale. The combination of a 1MPx+ (1244x1024px), high dynamic range (12-bit) camera and near-axis geometry of the acquisition provided by Oxford Instruments is unique on the market. This unique combination is required for high angle resolution, forward scattered diffraction acquisition needed for reliable, high precision strain measurements, which will impact DTU’s materials research tremendously. The unique Oxford Instrument solution (Near-Axis TKD) offers an order of magnitude improvement in sensitivity compared to conventional off-axis TKD acquisition allowing for robust data acquisition of beam sensitive materials at low beam current. Furthermore, the NA-TKD geometry allows for simultaneous acquisition of (low-distortion) Kikuchi and spot patterns required for depth information (surface vs. bulk) in thin-films. The Oxford NA-TKD system provides a unique solution for avoiding primary beam exposure to the high-sensitive Symmetry camera while acquiring spot patterns and thereby allow for higher sensitivity of spot patterns and Kikuchi patterns compared to competitor systems, where the detector is exposed to the high-intense primary beam as well. The Oxford system provides integrated automated large area data acquisition of combined diffraction data (spot and Kikuchi) and analytical data (EDX) extending the field-of-view, by automated stage-driven mapping. The integrated software for analysis (AZtec) provides high-speed, high-precision orientation mapping via pattern matching. DTU Nanolab’s focus on imaging and microanalysis of material science samples will push the field of nanoscale imaging within energy materials, quantum materials, and composite materials to name a few. The unique technical performance, robustness and reliability from the Oxford spectrometers and cameras as well as integration into already existing hardware at DTU Nanolab are necessary for successful development of the research fields by a varied user base. After extensive market research of commercially available systems and suppliers, DTU Nanolab has concluded that the AZtecHKL Expert system with Symmetry S3 camera is the only instrument meeting the high technical requirements and flexibility needed for DTU Nanolab to perform the variety of state-of-the-art experimental research proposed by DTU Nanolab and its user base. To serve DTU Nanolab’s user base and research portfolio, a detector system capable of acquiring simultaneous Transmission Kikuchi patterns (TKD), sport patterns, and analytical data in form of EDX is required. Furthermore, high-angle-resolution diffraction acquisition is necessary in order to meet the requirements of high-precision strain analysis of new tailored materials systems. In addition, automated large-area mapping is required to fully characterize the materials systems, DTU Nanolab and its user base are researching. The AZtecHKL Expert system with Symmetry S3 camera from Oxford Instruments is the only integrated system that provide those requirements. No other commercially available solutions meet the requirements.

6.1.

Result lot ldentifier : LOT-0000

6.1.2.

Information about winners

Winner :

Official name : Oxford Instruments GmbH

Tender :

Tender identifier : 9365

Identifier of lot or group of lots : LOT-0000

Contract information:

Identifier of the contract : 9365

Date on which the winner was chosen : 30/09/2024

Organisation signing the contract : Danmarks Tekniske Universitet - DTU

8.1.

ORG-0001

Official name : Danmarks Tekniske Universitet - DTU

Registration number : 30060946

Postal address : Anker Engelunds Vej 1

Town : Kgs. Lyngby

Postcode : 2800

Country subdivision (NUTS) : Nordsjælland ( DK013 )

Country : Denmark

Contact point : Per Christiansen

Email : perach@dtu.dk

Telephone : +45 45252525

Internet address : https://www.dtu.dk/

Buyer profile : https://eu.eu-supply.com/ctm/company/companyinformation/index/165863

Roles of this organisation :

Buyer

Organisation signing the contract

Organisation whose budget is used to pay for the contract

Organisation executing the payment

8.1.

ORG-0002

Official name : Klagenævnet for Udbud

Postal address : Nævnenes hus, Toldboden 2

Town : Viborg

Postcode : 8800

Country subdivision (NUTS) : Østjylland ( DK042 )

Country : Denmark

Email : klfu@erst.dk

Telephone : +45 35291000

Internet address : http://www.klfu.dk

Roles of this organisation :

Review organisation

8.1.

ORG-0003

Official name : Konkurrence- og Forbrugerstyrelsen

Postal address : Carl Jacobsens Vej 35

Town : Valby

Postcode : 2500

Country subdivision (NUTS) : Københavns omegn ( DK012 )

Country : Denmark

Email : kfst@kfst.dk

Telephone : +45 41715000

Internet address : http://www.kfst.dk

Roles of this organisation :

Organisation providing information concerning the general regulatory framework for taxes applicable in the place where the contract is to be performed

8.1.

ORG-0004

Official name : Oxford Instruments GmbH

Town : Wiesbaden

Postcode : 65205

Country subdivision (NUTS) : Weißenburg-Gunzenhausen ( DE25C )

Country : Germany

Contact point : Håkan Vikstrøm

Email : hakan.vikstrom@oxinst.com

Telephone : +46854481550

Roles of this organisation :

Tenderer

Winner of these lots : LOT-0000

8.1.

ORG-0005

Official name : Mercell Holding ASA

Registration number : 980921565

Postal address : Askekroken 11

Town : Oslo

Postcode : 0277

Country subdivision (NUTS) : Oslo ( NO081 )

Country : Norway

Contact point : eSender

Email : publication@mercell.com

Telephone : +47 21018800

Fax : +47 21018801

Internet address : http://mercell.com/

Roles of this organisation :

TED eSender

11.1.

Notice information

Notice identifier/version : f58ccd3d-ce78-49d4-b81f-cddd314fba1a - 01

Form type : Direct award preannouncement

Notice type : Voluntary ex-ante transparency notice

Notice subtype : 25

Notice dispatch date : 02/10/2024 09:28:53 (UTC)

Notice dispatch date (eSender) : 02/10/2024 10:00:44 (UTC)

Languages in which this notice is officially available : English

11.2.

Publication information

Notice publication number : 594456-2024

OJ S issue number : 193/2024

Publication date : 03/10/2024

Fakta om udbudet

Near Axis TKD detector

Danmarks Tekniske Universitet - DTU