High resolution xray diffractometer

Section I: Contracting authority/entity

I.1) Name and addresses

Technical University of Denmark
30060946
Anker Engelundsvej 1
Lyngby
2800
Denmark
Contact person: Louise Steen Halkier
E-mail: loush@adm.dtu.dk
NUTS code: DK0

Internet address(es):

Main address: www.dtu.dk

I.4) Type of the contracting authority

Body governed by public law

I.5) Main activity

Education

Section II: Object

II.1) Scope of the procurement

II.1.1) Title:

High resolution xray diffractometer.

II.1.2) Main CPV code

38300000

II.1.3) Type of contract

Supplies

II.1.4) Short description:

High Resolution X-Ray Diffractometer for user in clean room facility. The main applications will be measurements of thin films grown by different CVD techniques. The materials for measurement range from single crystalline to polycrystalline layers of many different materials such as Si, C, III-V materials and more. Measurement of film thickness, crystallinity, roughness crystal quality are needed.

II.1.6) Information about lots

This contract is divided into lots: no

II.1.7) Total value of the procurement (excluding VAT)

Value excluding VAT: 2 195 000.00 DKK

II.2) Description

II.2.1) Title:

II.2.2) Additional CPV code(s)

II.2.3) Place of performance

NUTS code: DK0

Main site or place of performance:

DTU Danchip, Ørsteds Plads, Bygning 347, 2800 Kgs. Lyngby.

II.2.4) Description of the procurement:

High Resolution X-Ray Diffractometer for user in clean room facility. The main applications will be measurements of thin films grown by different CVD techniques. The materials for measurement range from single crystalline to polycrystalline layers of many different materials such as Si, C, III-V materials and more. Measurement of film thickness, crystallinity, roughness crystal quality are needed.

In our cleanroom environment, it is crucial that we keep our samples clean and free from contamination. This must be considered through all processing and characterization steps. Measuring with XRD will be done between process steps and hence there cannot be used any kind of sticking material such as glue or tape on the samples as this will contaminate the samples. In some test samples, we have seen strong indication that a vacuum chuck introduces some stress to the sample limiting the measurement quality. It should also be mentioned that we have samples of odd sizes between 2 mm by 2 mm up to a diameter of 150 mm. For these reasons the Rigaku SmartLab with unique In-Plane arm, making it possible to do measurements without tilting samples, is the only solution that satisfies our needs.

II.2.5) Award criteria

Quality criterion - Name: Quality of the X-ray Diffractometer must be able to be function without glue or vacuum / Weighting: 100

Price - Weighting: 0

II.2.11) Information about options

Options: no

II.2.13) Information about European Union funds

The procurement is related to a project and/or programme financed by European Union funds: no

II.2.14) Additional information

Section IV: Procedure

IV.1) Description

IV.1.1) Type of procedure

Negotiated procedure without prior publication

The works, supplies or services can be provided only by a particular economic operator for the following reason:
- procurement aiming at the creation or acquisition of a unique work of art or artistic performance

Explanation:

High Resolution X-Ray Diffractometer for user in clean room facility. The main applications will be measurements of thin films grown by different CVD techniques. The materials for measurement range from single crystalline to polycrystalline layers of many different materials such as Si, C, III-V materials and more. Measurement of film thickness, crystallinity, roughness crystal quality are needed.

In our cleanroom environment, it is crucial that we keep our samples clean and free from contamination. This must be considered through all processing and characterization steps. Measuring with XRD will be done between process steps and hence there cannot be used any kind of sticking material such as glue or tape on the samples as this will contaminate the samples. In some test samples, we have seen strong indication that a vacuum chuck introduces some stress to the sample limiting the measurement quality. It should also be mentioned that we have samples of odd sizes between 2 mm by 2 mm up to a diameter of 150 mm. For these reasons the Rigaku SmartLab with unique In-Plane arm, making it possible to do measurements without tilting samples, is the only solution that satisfies our needs. Quality of the x-ray diffractometer must be able to function without glue or vacuum.

IV.1.3) Information about framework agreement

IV.1.8) Information about the Government Procurement Agreement (GPA)

The procurement is covered by the Government Procurement Agreement: yes

IV.2) Administrative information

IV.2.1) Previous publication concerning this procedure

Section V: Award of contract/concession

V.2) Award of contract/concession

V.2.1) Date of contract award decision:

09/08/2017

V.2.2) Information about tenders

The contract has been awarded to a group of economic operators: no

V.2.3) Name and address of the contractor/concessionaire

Ramcon A/S
12044976
Bregnerød 132
Birkerød
3460
Denmark
Telephone: +45 45942000
E-mail: ramcon@ramcon.dk
NUTS code: DK0

Internet address:www.ramcon.dk

The contractor/concessionaire will be an SME: yes

V.2.4) Information on value of the contract/lot/concession (excluding VAT)

Total value of the contract/lot/concession: 2 195 000.00 DKK

V.2.5) Information about subcontracting

Section VI: Complementary information

VI.3) Additional information:

VI.4) Procedures for review

VI.4.1) Review body

The Complaints Board for Public Procurement
Viborg
8800
Denmark
Telephone: +45 35291000

Internet address:www.kfst.dk

VI.4.2) Body responsible for mediation procedures

VI.4.3) Review procedure

VI.4.4) Service from which information about the review procedure may be obtained

Danish Competition and Consumer Authority
Carl Jacobsens Vej 35
Valby
2500
Denmark
Telephone: +45 41715000

Internet address:http://www.kfst.dk/

VI.5) Date of dispatch of this notice:

09/08/2017

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High resolution xray diffractometer

Technical University of Denmark

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